Work

Application of the Reverse Pulse Technique for Worst Case Transient Analysis in HPC PDN Design

Year: 2024

Type: conference-paper

Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

DOI: 10.1109/epeps61853.2024.10754562

Authors: Chad M. Smutzer, Jordan R. Keuseman, Alexander P. Hickman, Clifton R. Haider

Institution: Mayo Clinic

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404577428

FWCI:

Cites: 4

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Related to: 10