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Yield-Aware Interposer Design for UCIe Interconnects

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Year: 2024
Type: conference-paper
Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
DOI: 10.1109/epeps61853.2024.10753661
Authors: Ram Krishna, Ashita Victor, Srujan Penta, Xu Chen, Muhannad S. Bakir, Nam Sung Kim, Elyse Rosenbaum
Institutions: University of Illinois Urbana-Champaign, Georgia Institute of Technology
Language: English

Topic: 3D IC and TSV technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Science Foundation
Award: NNCI: Southeastern Nanotechnology Infrastructure Corridor (SENIC)
OpenAlex ID: W4404577435
FWCI: 1.562
Cites: 6
Cited by: 2
Related to: 10
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