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Parametric S-Parameter Prediction Using Deep Learning

Year: 2024

Type: conference-paper

Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

DOI: 10.1109/epeps61853.2024.10754126

Authors: Vinayak Bansal, Lihong Feng, Valentin de la Rubia, Peter Benner

Institutions: Indian Institute of Technology Delhi, Max Planck Institute for Dynamics of Complex Technical Systems, Universidad Politécnica de Madrid

Language: English

Topic: Microwave Engineering and Waveguides

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404577463

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