Work

Megtron 6 and 8 Characterization Methodology

Year: 2024

Type: conference-paper

Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

DOI: 10.1109/epeps61853.2024.10754166

Authors: Stefan de Araujo, Daniel de Araujo, Roger Delbue, Ryan Keegan

Institutions: The University of Texas at Austin, Siemens (Germany)

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404577484

FWCI: 0.806

Cites: 3

Cited by: 1

Related to: 10