Work

LSYOLO: an algorithm for linear scan PCB defect detection

Year: 2024

Type: article

Source: Measurement Science and Technology

DOI: 10.1088/1361-6501/ad95b0

Authors: Rui Chen, Zehuan Yu

Institution: East China University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G7450187648

OpenAlex ID: W4404581629

FWCI: 1.041

Cites: 29

Cited by: 5

Related to: 10