Work

Impact of deep and tail trap states on the electrical performance of double-gate ZnO thin film transistors

Year: 2024

Type: article

Source: Semiconductor Science and Technology

DOI: 10.1088/1361-6641/ad95b6

Authors: Saurabh Jaiswal, Jitendra Singh, Manish Goswami, Kavindra Kandpal

Institutions: Indian Institute of Information Technology Allahabad, Central Electronics Engineering Research Institute

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404581640

FWCI: 0.308

Cites: 45

Cited by: 3

Related to: 10