Eye-Diagram Edge Estimation (EEE) Network for Through Silicon via Design in Next-Generation High Bandwidth Memory
Year: 2024
Type: conference-paper
Authors: Hyunjun An, Junghyun Lee, Keeyoung Son, Seonguk Choi, Taein Shin, Keunwoo Kim, Jiwon Yoon, Taesoo Kim, Jungmin Ahn, Hyunah Park, Haeseok Suh, Joungho Kim
Institution: Korea Advanced Institute of Science and Technology
Language: English
Topic: 3D IC and TSV technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404609303