Work

WITHDRAWN: Investigation of on-pitch SGD structure induced V th distribution tails downshift in 3D NAND flash memory

Year: 2024

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.35848/1347-4065/ad967b

Authors: Zhihong Xu, Xuan Tian, Yuke Xiao, Liang Li, Wenlong Zhang, Liming Gao

Institution: Shanghai Jiao Tong University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404623355

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Cites: 13

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Related to: 10