Work

Revealing the Reliability Performance of a Dielectric-Modulated Negative Capacitance Junctionless FinFET Biosensor

Year: 2024

Type: article

Source: IEEE Transactions on Dielectrics and Electrical Insulation

DOI: 10.1109/tdei.2024.3504407

Authors: Navneet Gandhi, Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Ankit Dixit, Naveen Kumar, Vihar Georgiev, Navjeet Bagga

Institutions: Indian Institute of Information Technology Design and Manufacturing Jabalpur, Manipal Academy of Higher Education, Government of Uttar Pradesh, University of Glasgow, Indian Institute of Technology Bhubaneswar

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404627795

FWCI: 1.249

Cites: 30

Cited by: 12

Related to: 10