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Thermal Parameter Reconstruction Imaging for Interlayer Defect Detection in ECPT

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Year: 2024
Type: article
Source: IEEE Transactions on Industrial Informatics
DOI: 10.1109/tii.2024.3495784
Authors: Yiping Liang, Libing Bai, Lulu Tian, Xu Zhang, Yong Gao
Institutions: University of Electronic Science and Technology of China, Hebei University of Science and Technology
Language: English

Topic: Thermography and Photoacoustic Techniques
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China
Awards: G2594518071, G6076953923, G6854158270, G7303024107
OpenAlex ID: W4404627847
FWCI: 0.61
Cites: 33
Cited by: 4
Related to: 10
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