A Novel Fault Transient Analysis Method for DC Lines Considering Multiple Refractions and Reflections of Traveling Waves
Year: 2024
Type: conference-paper
Authors: Mingyu Shao, Jiawei He, Zhiwen Suo, Zezhou Chang
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404628159
