Work

[Invited] Resistive Scanning Thermal Microscopy for localizing and monitoring defects in electronics

Year: 2024

Type: conference-paper

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Author: Gomés, Séverine

Institution: Centre d'Énergétique et de Thermique de Lyon

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404679922

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