Impact of Temperature on Digital Integrated Circuits in a 4H-SiC CMOS Technology
Year: 2024
Type: article
Authors: Zewei Dong, Yun Bai, Chengyue Yang, Yidan Tang, Jilong Hao, Xuan Li, Xiaoli Tian, Xinyu Liu
Institutions: Chinese Academy of Sciences, Institute of Microelectronics
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404688660