Work

The Effect of Heavy-Ion Strikes on Charge Trap Memory Arrays With Analog State Programmability

Year: 2024

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2024.3505962

Authors: T. Patrick Xiao, Christopher H. Bennett, Ryan Dempsey, Donald Wilson, Joshua Joffrion, Darlene M. Udoni, A. Alec Talin, Vineet Agrawal, Helmut Puchner, Matthew J. Marinella, Sapan Agarwal, David R. Hughart

Institutions: Sandia National Laboratories, Arizona State University, Sandia National Laboratories California

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Sandia National Laboratories

Award: G413247060

OpenAlex ID: W4404688718

FWCI: 0.308

Cites: 25

Cited by: 3

Related to: 10