Work

Enhanced Condition Assessment of IGBTs Through 3D Segmented Reconstruction Simulation

Year: 2024

Type: conference-paper

Source: IEEE Student Conference on Electric Machines and Systems (SCEMS)

DOI: 10.1109/scems63294.2024.10756452

Authors: Bin Yuan, Yan Yu, Yongqi Cen, Zhenxin Sun, Meiqiao Li, Yixiao Sun, Yanqi Su, Donglai Wang

Institutions: Shenyang Institute of Engineering, State Grid Corporation of China (China)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: International Science and Technology Cooperation Programme

Award: G3101503239

OpenAlex ID: W4404689376

FWCI:

Cites: 19

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Related to: 10