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Generative Model-Based Test Case Generation and Operational Testing for Deep Learning

Year: 2024

Type: conference-paper

DOI: 10.1109/icbase63199.2024.10762049

Authors: Shenglin Bao, Nan Jiang, Weijie Zhu, Pei Zhang

Institution: Shanghai Institute of Computing Technology

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404739748

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Cites: 6

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Related to: 10