Work

Total-Dose-Induced Threshold Voltage Shift Dependence on Tier Pitch in 3-D nand Flash Memories

Year: 2024

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2024.3506787

Authors: Marta Bagatin, Silvia Beltrami, Alessandro Paccagnella, Simone Gerardin

Institution: University of Padua

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404740176

FWCI: 0.312

Cites: 22

Cited by: 3

Related to: 10