Work

Automatic Generation of Contrast Maps in Terms of van der Waals Material Properties in Bimodal AFM

Year: 2024

Type: article

Abstract: High Resolution Image Download MS PowerPoint Slide van der Waals (vdW) forces are of interest in colloid science, biophysics, cell biology, and the field of vdW heterostructures. We present a model and method to quantify vdW material properties of samples routinely in standard bimodal atomic force microscopy (AFM) without the need to establish mechanical contact with the samples. The method preserves the high resolution of bimodal AFM but enhances contrast by exploiting several transforms that lead to the production of contrast maps in the form of vdW material properties, i.e., Hamaker constant, adhesion, surface energy, peak forces, and surface energy hysteresis. We show that some of these maps provide information that is otherwise concealed in the raw channels.

Source: The Journal of Physical Chemistry C

DOI: 10.1021/acs.jpcc.4c06040

Authors: Sergio Santos, Lamiaa Elsherbiny, Chia-Yun Lai, Khalid Askar, Karim Gadelrab, Matteo Chiesa

Institutions: UiT The Arctic University of Norway, Khalifa University of Science and Technology, Masdar Institute of Science and Technology, Massachusetts Institute of Technology

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $4,500

Funder: Advanced Technology Research Council