Analysis of the Correlation Between Reliability Indices and Outage Costs in MVDC Systems
Year: 2024
Type: article
Authors: Yun-Jin Cho, Dong-Il Cho, Seong-Jun Park, Jun-Hyuk Nam, Tae-Yang Nam, Won-Sik Moon
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404753654
