An Empirical Study of High-Risk Vulnerabilities in IoT Systems
Year: 2024
Type: article
Source: IEEE Internet of Things Journal
Authors: Xiang Chen, Changlin Yang, Yuhong Nan, Zibin Zheng
Institution: Sun Yat-sen University
Language: English
Topic: IoT and Edge/Fog Computing
Subfield: Computer Networks and Communications
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Award: G1849465935
OpenAlex ID: W4404787932