Work

Probabilistic Deep Learning Based on Bayes by Backprop for Remaining Useful Life Prognostics of Consumer Electronics

Year: 2024

Type: article

Source: IEEE Transactions on Consumer Electronics

DOI: 10.1109/tce.2024.3507006

Authors: Guochao Wang, Yu Wang, Baotong Li, Bin Zhang

Institutions: State Key Laboratory of Mechanical Manufacturing System Engineering, Xi'an Jiaotong University, University of South Carolina

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Guangxi Key Lab of Manufacturing System and Advanced Manufacturing Technology, National Key Research and Development Program of China

Awards: G1455016712, G2562910675, G8392805203

OpenAlex ID: W4404788462

FWCI: 1.099

Cites: 31

Cited by: 7

Related to: 10