Minimization of Measurement Uncertainty in Optical Frequency Domain Reflectometry
Year: 2024
Type: article
Source: Journal of Lightwave Technology
Authors: Daniel C. Sweeney, Christian M. Petrie
Institution: Oak Ridge National Laboratory
Language: English
Topic: Advanced Fiber Optic Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404788930