Depth‐of‐Discharge Dependent Capacity Decay Induced by the Accumulation of Oxidized Lattice Oxygen in Li‐Rich Layered Oxide Cathode
Year: 2024
Type: article
Source: Angewandte Chemie
Authors: Kang Zhang, Yilong Chen, Yuanlong Zhu, Qizheng Zheng, Yonglin Tang, Dongyan Yu, Qirui Liu, Haiyan Luo, Jianhua Yin, Linhui Zeng, Wen Jiao, Na Liu, Qingsong Wang, Lirong Zheng, Jing Zhang, Yongchen Wang, Baodan Zhang, Yawen Yan, Huan Huang, Chong‐Heng Shen, Yu Qiao, Shi‐Gang Sun
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G1115795887, G6037087216
OpenAlex ID: W4404827178
