Machine-Learning Mental-Fatigue-Measuring μm-Thick Elastic Epidermal Electronics (MMMEEE)
Year: 2024
Type: article
Source: Nano Letters
Authors: Haogeng Liu, Haichuan Li, Yexiong Wang, Yan Liu, Lizhi Xiao, Weidong Guo, Yaoguang Lin, Hongteng Wang, Tianqi Wang, Haiwang Yan, Shunkai Lai, Yaofei Chen, Zongxia Mou, Lei Chen, Yunhan Luo, Gui-Shi Liu, Xingcai Zhang
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404833971
