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Using Graph Theory on its Full Extent to Speed-up the Analysis of Resistive Grids

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Engineering Veracruz (ICEV)

DOI: 10.1109/icev63254.2024.10766024

Authors: Arturo Sarmiento-Reyes, Juan Manuel Ugalde-Franco, Luis Hernandez-Martinez, Carlos Arrieta-Fierro

Institution: National Institute of Astrophysics, Optics and Electronics

Language: English

Topic: Engineering and Technology Innovations

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404847805

FWCI: 0.806

Cites: 5

Cited by: 1

Related to: 10