Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant
Year: 2024
Type: conference-paper
Authors: Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404847842