Cross-Layer Reliability Evaluation of In-Memory Similarity Computation
Year: 2024
Type: conference-paper
Authors: Ali Nezhadi, Mahta Mayahinia, Mehdi Tahoori
Institution: Karlsruhe Institute of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404847880
