A Robust On-Chip Sensor for Online Monitoring of BTI-Induced Aging in Integrated Circuits
Year: 2024
Type: conference-paper
Authors: Daniel Adjei, Emmanuel Nti Darko, Degang Chen
Institution: Iowa State University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404847972