Work

Calibrating the Dark Count Rate of Single Photon Avalanche Diodes Using Linear Regression

Year: 2024

Type: conference-paper

Source: International SoC Design Conference

DOI: 10.1109/isocc62682.2024.10762487

Authors: Youngmin Cho, Jinwook Burm

Institution: Sogang University

Language: English

Topic: Advanced Optical Sensing Technologies

Subfield: Instrumentation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: National Research Foundation, Korea Institute for Advancement of Technology, Samsung, Technology Development

OpenAlex ID: W4404848057

FWCI:

Cites: 2

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Related to: 10