Work

Write Bias Scheme Optimization of Ferroelectric Field-Effect-Transistor (FeFET) Synapse for Accurate On-chip Training

Year: 2024

Type: conference-paper

Source: International SoC Design Conference

DOI: 10.1109/isocc62682.2024.10762218

Authors: Seungmin Kang, Sangwan Kim, Sihyun Kim

Institution: Sogang University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404849185

FWCI:

Cites: 3

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Related to: 10