Work

Detection, measurement, and segmentation of aluminum profiles

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Engineering Veracruz (ICEV)

DOI: 10.1109/icev63254.2024.10766007

Authors: David Villanueva, Juan-Gabino Diaz-Martinez, G. Flores-Erana, Irandi Gutérrez-Carmona

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404849245

FWCI: 0.723

Cites: 6

Cited by: 1

Related to: 10