Work

Analysis of Test Environment Configuration for High-Speed Link Chip Measurement

Year: 2024

Type: conference-paper

Source: International SoC Design Conference

DOI: 10.1109/isocc62682.2024.10762686

Authors: Yunseong Jo, Hyuntae Kim, Jaeduk Han

Institution: Hanyang University

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404849250

FWCI:

Cites: 4

Cited by:

Related to: 10