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Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-constrained IoT Edge Devices

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00040

Authors: Geancarlo Abich, Ricardo Reis, Luciano Ost

Institutions: Universidade Federal do Rio Grande do Sul, Loughborough University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404849364

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Cites: 16

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Related to: 10