A 28-nm 10.4-fJ/b Cryogenic embedded DRAM with 3T1C Gain Cell and MBIST at 4-Kelvin
Year: 2024
Type: conference-paper
Institutions: Fudan University, ShanghaiTech University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404849571
