Work

Role of thermal and electric fields in the failure mechanism of metallized film capacitors: insights from molecular chain dynamics within polymer dielectrics

Year: 2024

Type: article

Source: Journal of Physics D Applied Physics

DOI: 10.1088/1361-6463/ad98a6

Authors: Jie Zhang, Feipeng Wang, Jian Zhou, Zhicheng Zhang, Jian Li, Weigen Chen

Institutions: Chongqing University, Xi'an Jiaotong University

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G3879324640, G7364527298

OpenAlex ID: W4404874597

FWCI: 4.352

Cites: 48

Cited by: 46

Related to: 10