Work

Variation-aware analysis of buried-channel-array transistors (BCATs) in scaled DRAM: insights from 3D quasi-atomistic simulations

Year: 2024

Type: article

Source: Semiconductor Science and Technology

DOI: 10.1088/1361-6641/ad98bb

Authors: Seokchan Yoon, Jaehyuk Lim, Changhwan Shin

Institutions: Korea University, Sungkyunkwan University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation of Korea

Awards: G3802875617, G623835629

OpenAlex ID: W4404875666

FWCI:

Cites: 30

Cited by:

Related to: 10