Work

Radiation Stability of the p-Type SnOx TFT with Al2O3 and HfO2 Passivation Layers

Year: 2024

Type: article

Source: ACS Applied Electronic Materials

DOI: 10.1021/acsaelm.4c01288

Authors: Tianli Lv, Wenjing Qin, Ruohao Hong, Junjian You, Yawei Lv, Lei Liao, Changzhong Jiang

Institutions: Hunan Normal University, Hunan University, China Electronics Technology Group Corporation

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Education Department of Hunan Province, Natural Science Foundation of Hunan Province

Awards: G1027743626, G1402192921, G6268877333

OpenAlex ID: W4404947344

FWCI: 1.542

Cites: 40

Cited by: 15

Related to: 10