Work

Towards Mutation Testing of Embedded Software: A Framework and Case Study

Year: 2024

Type: conference-paper

Source: IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)

DOI: 10.1109/issrew63542.2024.00072

Authors: Wei Jiang, Sijin Dong, Jiaming Zhang, Jin Tang, Zichao Zhang, Chang-ai Sun, Xiaoyi Zhang

Institutions: China Electronics Technology Group Corporation, University of Science and Technology Beijing

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Aeronautical Science Foundation of China

OpenAlex ID: W4404953102

FWCI:

Cites: 30

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Related to: 10