Work

Non-Destructive Testing of Resistive Components Using Low-Frequency Noise Measurement

Year: 2024

Type: conference-paper

Source: Intelligent Technologies and Electronic Devices in Vehicle and Road Transport Complex (TIRVED)

DOI: 10.1109/tirved63561.2024.10769821

Authors: Vyacheslav A. Sokurenko, Yuri V. Sakharov

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Ministry of Science and Higher Education of the Russian Federation

OpenAlex ID: W4404953320

FWCI:

Cites: 4

Cited by:

Related to: 10