Work

Electrochemical Models for Connector Degradation

Year: 2024

Type: conference-paper

Source: IEEE Holm Conference on Electrical Contacts (HOLM)

DOI: 10.1109/holm56222.2024.10768585

Authors: David M. Williams, Matthew Jimkoski, Mary K. Williams

Institution: Nexteer Automotive (United States)

Language: English

Topic: Electrical Contact Performance and Analysis

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404954055

FWCI: 2.677

Cites: 26

Cited by: 2

Related to: 10