Work

FVDCLS: Functional Verification of RISCV Based Dual-Core Lockstep Feature Using Fault Injection Mechanism

Year: 2024

Type: conference-paper

Source: IFIP/IEEE International Conference on Very Large Scale Integration

DOI: 10.1109/vlsi-soc62099.2024.10767783

Authors: Muhammad Kashif Minhas, Haroon Waris, Sajid Baloch

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404954136

FWCI: 3.221

Cites: 6

Cited by: 4

Related to: 10