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A Lightweight Model Solution for Aluminum Material Defect Detection at the Edge

Year: 2024

Type: conference-paper

Source: IEEE International Symposium on Industrial Embedded Systems (SIES)

DOI: 10.1109/sies62473.2024.10768079

Authors: Zhengzhou Chen, Jinhao Liang, Yueling Zhang, Jiangtao Wang, Qing Zhang, Gang Xu

Institution: East China Normal University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404954146

FWCI:

Cites: 26

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Related to: 10