Work

DelayAVF: Calculating Architectural Vulnerability Factors for Delay Faults

Year: 2024

Type: conference-paper

Source: Proceedings of the ... annual International Symposium on Microarchitecture/Proceedings of the annual International Symposium on Microarchitecture

DOI: 10.1109/micro61859.2024.00026

Authors: Peter W. Deutsch, Vincent Quentin Ulitzsch, Sudhanva Gurumurthi, Vilas Sridharan, Joel S. Emer, Mengjia Yan

Institutions: Massachusetts Institute of Technology, Technische Universität Berlin, Advanced Micro Devices (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

Award: Collaborative Research: PPoSS: LARGE: A Full-Stack Architecture for Sparse Computation

OpenAlex ID: W4404954359

FWCI: 10.9

Cites: 43

Cited by: 14

Related to: 10