Work

Defect Detection of Intelligent Storage Items Based on YOLO Algorithm

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Information Systems and Computer Aided Education (ICISCAE)

DOI: 10.1109/iciscae62304.2024.10761469

Authors: Guo Zhiping, Ye Han, Liu Wei, Zhang Shengwu

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404954467

FWCI:

Cites: 1

Cited by:

Related to: 10