Work

Absence of Electrical Contact Resistance Degradation in MEMS Relays Subject to Hot Switching

Year: 2024

Type: conference-paper

Source: IEEE Holm Conference on Electrical Contacts (HOLM)

DOI: 10.1109/holm56222.2024.10768591

Authors: Deepak Kumar, Maarten P. De Boer

Institution: Carnegie Mellon University

Language: English

Topic: Electrical Contact Performance and Analysis

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, Carnegie Mellon University

Awards: LEAP-HI: Ultra-Low Power Computing: A Disruptive Approach Through a New Integrated Nanomechanics Framework, G848303824

OpenAlex ID: W4404954629

FWCI:

Cites: 28

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Related to: 10