Work

Transistor-Level Logic Gates Ranking Strategy for Selective Hardening

Year: 2024

Type: conference-paper

DOI: 10.1109/sbesc65055.2024.10771816

Authors: Glória D. Claro da Silva, Rafael B. Schvittz, Paulo F. Butzen

Institutions: Universidade Federal do Rio Grande, Universidade Federal do Rio Grande do Sul

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404955177

FWCI: 0.781

Cites: 15

Cited by: 1

Related to: 10