Work

Defect-based Testing for Safety-critical ML Components

Year: 2024

Type: conference-paper

Source: IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)

DOI: 10.1109/issrew63542.2024.00088

Authors: Amit Sahu, Carmen Cârlan

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404955312

FWCI:

Cites: 31

Cited by:

Related to: 10