Work

Enhancing Few-shot Learning for Metal Defect Classification with CBAM and Graph Embedding

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Information Systems and Computer Aided Education (ICISCAE)

DOI: 10.1109/iciscae62304.2024.10761490

Authors: Xinhang Song, Nuo Cheng, Yi Hu

Institution: Southwest University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404955365

FWCI:

Cites: 20

Cited by:

Related to: 10