Work

Research on high-temperature protection technology for uncooled IR imager

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3034654

Authors: Peng Shi, Yuanyao Li, Haiteng Li, Jifang Shan, Hailiang Zhou, Zhiwei Dai

Institution: Tianjin Institute of Metrological Supervision Testing

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404992649

FWCI:

Cites: 1

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Related to: 10