Work

Effect of integration time on the performance parameters of InGaAs detectors

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3032585

Authors: Xi Luo, Yuebo Liu, Yichi Zhang, Jianting Lu, ZhiPeng Wei, Shaohua Yang

Institutions: Changchun University of Science and Technology, China Electronic Product Reliability and Environmental Test Institute

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404992823

FWCI: 0.779

Cites: 11

Cited by: 1

Related to: 10